Method and apparatus for calculating a scalar quality metric...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing

Reexamination Certificate

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C716S108000, C716S136000

Reexamination Certificate

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07958466

ABSTRACT:
A method for generating a scalar quality metric value for a design solution includes reflectings one or more qualities of the design solution with respect to two or more domains in the system. Other embodiments are also disclosed.

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