Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-11-28
2006-11-28
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07141998
ABSTRACT:
The present invention provides a method and apparatus for optimizing the burn-in of integrated circuits. One embodiment of the method comprises: performing a first portion of the burn-in process of the integrated circuit; monitoring a power dissipation of the integrated circuit during the first portion of the burn-in process; increasing a burn-in temperature until the power dissipation of the integrated circuit reaches a predetermined maximum power dissipation; and performing a subsequent portion of the burn-in process of the integrated circuit at the increased burn-in temperature.
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Oleg Semenov et al, Burn-in Temperature Projections for Deep Sub-micron Technologies, 2003 (No Month), IEEE, ITC International Test Conference, Paper 4.3, pp. 95-104.
Abadeer Wagdi W.
Pilo Harold
Seitzer Daryl M.
Hoffman, Warmick & D'Alessandro LLC
Hollington Jermele
LeStrange Michael J.
Vazquez Arleen M.
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