Method and apparatus for brain waveform examination

Details Method and apparatus for brain waveform examination Method and apparatus for brain waveform examination

1976-07-15

1978-06-06

Kamm, William E.

Surgery

Truss

Perineal

A61B 504

Patent

active

040929817

ABSTRACT:
A neural efficiency rating is arrived at by amplifying and band-limiting an EEG waveform of a subject, discarding those parts of the waveform during which alpha rhythm is present, and measuring the average frequency of the remainder of the waveform. By comparing the phases and amplitudes of the waveforms produced by opposite sides of the subject's brain, abnormalities of brain function may be detected, which together with the neural efficiency rating serves to evaluate brain function.

REFERENCES:
patent: 3760796 (1973-09-01), Baessler et al.
patent: 3890957 (1975-06-01), Freeman
patent: 3978847 (1976-09-01), Fehmi et al.
Marsoner et al., "Medical & Biological Engineering," vol. 8, No. 4, Jul., 1970, pp. 415-418.
Paskewitz, "Psychophysiology," vol, 8, No. 1, Jan., 1971, pp. 107-112.
Emide et al., "Electroencephalography and Clinical Neurophysiology," vol. 37, No. 2, Aug., 1974, pp. 185-187.

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