Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-09-29
2009-10-20
Chang, Jon (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S268000
Reexamination Certificate
active
07606423
ABSTRACT:
A method includes detecting vertical edge pixels in an image and analyzing the detected vertical edge pixels by horizontal location in the image to detect a spatial periodicity in the detected vertical edge pixels. The method further includes detecting horizontal edge pixels in the image, and analyzing the detected horizontal edge pixels by vertical location in the image to detect a spatial periodicity in the detected horizontal edge pixels.
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Caviedes Jorge E.
Ferzli Rony
Subedar Mahesh M.
Tang Wen-Tsung
Buckley Maschoff & Talwalkar LLC
Chang Jon
Intel Corporation
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