Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2007-04-03
2007-04-03
Ferris, Fred (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S013000, C703S015000, C703S020000, C714S033000, C714S718000, C700S086000
Reexamination Certificate
active
10371382
ABSTRACT:
A method for identifying predictable data sharing locations includes generating a testcase thread of code, creating a list of data lines used by the generated testcase thread of code, and generating a list of predictable data sharing locations based on the data line list.
REFERENCES:
patent: 5673272 (1997-09-01), Proskauer et al.
patent: 5774358 (1998-06-01), Shrote
patent: 5924098 (1999-07-01), Kluge
patent: 5953530 (1999-09-01), Rishi et al.
patent: 6117181 (2000-09-01), Dearth et al.
patent: 6170018 (2001-01-01), Voll et al.
patent: 6247121 (2001-06-01), Akkary et al.
patent: 6275956 (2001-08-01), On et al.
patent: 6345242 (2002-02-01), Dearth et al.
patent: 6804631 (2004-10-01), Kelley et al.
patent: 6845440 (2005-01-01), Thompson et al.
patent: 7000233 (2006-02-01), Levitan et al.
patent: 7024347 (2006-04-01), Watanabe et al.
patent: 7065676 (2006-06-01), Lang et al.
patent: 7103812 (2006-09-01), Thompson et al.
patent: 2006/0058976 (2006-03-01), Ferris
“AVPGEN—A Test Generator for Architecture Verification”, Chandra et al, IEEE Transactions of VLSI Systems, vol. 3, No. 2, Jun. 1995.
“Directions in Multiprocessor Verification”, Logan, IEEE 0-7803-2492-7/95, 1995 IEEE.
“Test Floor Verification on Multiprocessor hardware”, Saha et al, IEEE 0-7803-3255-5/96, 1996, IEEE.
Maly John W.
Thompson Ryan C.
Ferris Fred
Hewlett--Packard Development Company, L.P.
LandOfFree
Method and apparatus for biased identification of potential... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for biased identification of potential..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for biased identification of potential... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3738909