Electricity: measuring and testing – Of geophysical surface or subsurface in situ – Using electrode arrays – circuits – structure – or supports
Reexamination Certificate
2006-09-19
2006-09-19
Patidar, Jay M. (Department: 2862)
Electricity: measuring and testing
Of geophysical surface or subsurface in situ
Using electrode arrays, circuits, structure, or supports
C324S373000, C324S374000, C324S375000
Reexamination Certificate
active
07109719
ABSTRACT:
An azimuthal resistivity logging tool includes one or more pads for making azimuthal resistivity measurements of earth formation. Current from the pads, guard electrodes and a measure electrode are measured while monitoring the voltage difference between pairs of monitor electrodes. The pads and an adjacent portion of the tool body form a guard electrode. In addition, microelectrodes are provided on the pads for obtaining high resolution resistivity measurements.
REFERENCES:
patent: 3075142 (1963-01-01), Albright et al.
patent: 3262050 (1966-07-01), Threadgold et al.
patent: 3772589 (1973-11-01), Scholberg
patent: 4468623 (1984-08-01), Gianzero et al.
patent: 4697150 (1987-09-01), Marquis
patent: 5036283 (1991-07-01), Trouiller et al.
patent: 5049822 (1991-09-01), Zoltan et al.
patent: 5162740 (1992-11-01), Jewell
patent: 5396175 (1995-03-01), Seeman
patent: 5399971 (1995-03-01), Seeman et al.
patent: 6025722 (2000-02-01), Evans et al.
patent: 6060885 (2000-05-01), Tabarovsky et al.
patent: 6348796 (2002-02-01), Evans et al.
patent: 6801039 (2004-10-01), Fabris et al.
patent: 2002/0153897 (2002-10-01), Evans et al.
patent: 2003/0155925 (2003-08-01), Tabarovsky et al.
patent: 2003/0164705 (2003-09-01), Cheung et al.
patent: 2003/0164706 (2003-09-01), Iwanicki et al.
patent: 2003/0173968 (2003-09-01), Cheung et al.
patent: 2004/0051531 (2004-03-01), Chernali et al.
patent: 2611920 (1988-09-01), None
patent: 928583 (1963-06-01), None
J.W. Smits et al.;High Resolution From a New Laterolog With Azimuthal Imaging, SPE 30584, 1995 SPE Annual Technical Conference and Exhibition, Oct. 22-25, 1995, pp. 563-576, 14 Figs.
Fabris Antonio
Khokhar Rashid
Baker Hughes Incorporated
Madan Mossman & Sriram P.C.
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