Method and apparatus for automatically testing semiconductor dio

Details Method and apparatus for automatically testing semiconductor dio Method and apparatus for automatically testing semiconductor dio

1996-09-05

1998-01-06

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324115, 324133, G01R 2912

Patent

active

057059365

ABSTRACT:
A potable electronic test instrument is adapted for the automatic testing of semiconductor diodes regardless of the orientation of the diode relative to the test probes. The test instrument supplies an a.c. sine wave test voltage coupled to the test probes. The maximum negative voltage and the maximum positive voltage are measured and compared against a set of predetermined open and short circuit values to obtain a decision of open, short, or ok for each value. The combination of the two comparisons is used to determine the device status according to a decision criteria. The diode status is accordingly displayed on the graphical display of the test instrument, indicating the device is open, shorted, a diode with a forward orientation or a reverse orientation with respect to the test probes, or of an unknown type. The diode forward bias junction voltage is displayed regardless of its orientation.

REFERENCES:
patent: 4346347 (1982-08-01), Kamata et al.
patent: 5355082 (1994-10-01), Schreibner et al.
patent: 5414373 (1995-05-01), Schreibner et al.

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