Measuring and testing – Gas analysis – With compensation detail
Patent
1994-09-13
1996-03-12
Williams, Hezron E.
Measuring and testing
Gas analysis
With compensation detail
73 233, 7386301, 436156, G01N 2712, G01N 3002
Patent
active
054976510
ABSTRACT:
A method and a system for analyzing gas samples employ at least two semiconductor sensor sets, used alternately. The sensor output signals are time-differentiated. As a result of these features, the time required for analysis can be reduced considerably, especially with an uninterrupted sequence of analyses to be performed in succession.
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Burtscher Heinz
Matter Ulrich
Mukrowsky Michael
Nunlist Rene
Lehmann Martin
Wiggins J. David
Williams Hezron E.
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