Method and apparatus for automated wafer level testing and relia

Details Method and apparatus for automated wafer level testing and relia Method and apparatus for automated wafer level testing and relia

1995-07-31

1998-10-13

Trammell, James P.

Data processing: measuring, calibrating, or testing

Testing system

438 17, 324765, 324719, 702 57, G01R 1750

Patent

active

058227172

ABSTRACT:
Methods and apparatus are disclosed for testing integrated circuits at the wafer level and for integrating test results, calculation of lifetimes and generation of trend charts in a common database following testing. A wafer tester controller is supplemented with additional hardware and software to avoid data transfer errors and facilitate processing and storage of test results. The data base is available over a network to all areas of an organization.

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EDN Electrical Design News, "Networked Automatic Test Equipment Improves Manufacturing Efficiency" pp. 47-56, vol. 28, No. 5, Mar. 1983, Newton, Massachusetts U.S.

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