Method and apparatus for automated reading of vernier patterns

Radiant energy – Means to align or position an object relative to a source or...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

2504922, 356400, 356401, 368490, G01N 2304

Patent

active

047422335

ABSTRACT:
Automatic determination of the lateral offset between a pair of overlapping vernier patterns (20 and 22) on overlying layers (14 and 15) of a semiconductor wafer (10) is achieved by first capturing the image of the vernier patterns using a television camera (26). The output signal of the television camera is processed by an image acquisition circuit (32) coupled to a computer (34) to determine the intensity of each of a plurality of pixels lying within a strip extending across the image of the vernier patterns. The intensity of each of the pixels is mathematically correlated by the computer (34) with each of a plurality of values corresponding to the intensity of each of a plurality of pixels comprising an image representative of a pair of aligned vernier patterns. The location within the captured image of the maximum of the correlated intensities is then found. The offset between the pair of vernier patterns is determined in accordance with the distance between the location of the maximum of the correlated intensities and the center of one of the pair of vernier patterns.

REFERENCES:
patent: 4200395 (1980-05-01), Smith et al.
patent: 4292672 (1981-09-01), Southgate
patent: 4349880 (1982-09-01), Southgate
patent: 4449193 (1984-05-01), Tournois

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for automated reading of vernier patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for automated reading of vernier patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for automated reading of vernier patterns will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1507944

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.