Method and apparatus for automated debug and optimization of...

Data processing: artificial intelligence – Knowledge processing system – Knowledge representation and reasoning technique

Reexamination Certificate

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C702S117000, C702S118000, C702S182000, C702S183000, C714S026000, C714S703000, C714S724000, C714S736000, C324S1540PB, C324S765010

Reexamination Certificate

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10839955

ABSTRACT:
A method and apparatus for automatically debugging and optimizing an in-circuit test that is used to test a device under test on an automated tester is presented. The novel test debug and optimization technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid stable, and preferably optimized, test for execution on an integrated circuit tester.

REFERENCES:
patent: 6594610 (2003-07-01), Toutounchi et al.
patent: 6707313 (2004-03-01), Rohrbaugh et al.
patent: 6714035 (2004-03-01), Witte
patent: 7089139 (2006-08-01), Loh et al.
patent: 2003/0079189 (2003-04-01), Abadir et al.
patent: 2003/0171906 (2003-09-01), Parulkar et al.
Yamada,A. et. al. “Automatic Test Generation for Large Digital Circuits” 1977.
Huang,W-H. et. al. “ATPRG: An Automatic Test Program Generator Using HDL-A for Fault Diagnosis of Analog/Mixed-Signal Integrated Circuits” 1998.
Corno,F. et. al. “Automatic Test Program Generation: A Case Study” Mar. 2004.
Marr,D.T. “Multiprocessor Validation of the Pentium Pro” 1996.
Schulz,M.H. et. al. “SOCRATES: A Highly Efficient Automatic Test Pattern Generation System” 1988.
Flores,P.F. et. al. “An Exact Solution to the Minimum Size Test Pattern Problem” 2001.
Rudnick,E.M. et. al. “Sequential Circuit Test Generation in a Genetic Algorithm Framework” 1994.

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