Method and apparatus for automated debug and optimization of...

Data processing: artificial intelligence – Knowledge processing system – Knowledge representation and reasoning technique

Reexamination Certificate

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C702S117000, C702S118000, C702S182000, C702S183000, C714S026000, C714S703000, C714S724000, C714S736000, C324S1540PB, C324S765010

Reexamination Certificate

active

07324982

ABSTRACT:
A method and apparatus for automatically debugging and optimizing an in-circuit test that is used to test a device under test on an automated tester is presented. The novel test debug and optimization technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid stable, and preferably optimized, test for execution on an integrated circuit tester.

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Schulz,M.H. et. al. “SOCRATES: A Highly Efficient Automatic Test Pattern Generation System” 1988.
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