Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-05-27
2008-05-27
Barlow, Jr., John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S189000, C455S446000, C455S422100, C235S462460
Reexamination Certificate
active
11361911
ABSTRACT:
A method for generating radio frequency (RF) planning modeling data for an object. The method includes placing an RF signal source near the object and sequentially positioning a receiver at a plurality of locations around the object. At each of the locations, an indication is provided to the receiver that it is at a measurement location, and the receiver is allowed to detect a level of the RF signal produced by the RF signal source at the measurement location. In another aspect, an opening in an object is modeled as a virtual object that overlaps with the object and has a “negative attenuation” characteristic to cancel out the “positive attenuation” characteristic of the object.
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Dundar Baris
Kwon Jaimyoung
Liao Raymond Rui-Feng
Yu Wei
Barlow Jr. John E
Siemens Aktiengesellschaft
Vo Hien
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