Method and apparatus for assessing the residual life of a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S182000, C073S799000

Reexamination Certificate

active

07840362

ABSTRACT:
The life of a sensor unit is very strongly dependent on the loading of the sensor unit during use. The life of a sensor unit is generally specified in a number of loading cycles, however, which does not take into consideration the loading of the sensor unit. The invention therefore specifies a method and apparatus for assessing the residual life of a sensor unit which takes into consideration the actual loading of the sensor unit and therefore the residual life of the sensor unit can be estimated more precisely by virtue of a damage factor (S) being determined for the loading of a loading cycle (B) and the loading cycle (B) being weighted therewith.

REFERENCES:
patent: 6434512 (2002-08-01), Discenzo
patent: 7487066 (2009-02-01), Sundermeyer et al.
patent: 2006/0243055 (2006-11-01), Sundermeyer et al.
patent: 10209318 (2003-09-01), None
English Abstract of DE10209318.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for assessing the residual life of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for assessing the residual life of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for assessing the residual life of a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4176317

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.