Method and apparatus for assessing surface roughness

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry

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358101, 382 28, 36455101, 73105, H04N 700, H04N 718

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active

048781142

ABSTRACT:
A relatively low cost processor based optical system is used to carry out the method. An area of the surface whose roughness is to be assessed is illuminated by a light source, and a reflected light is directed to the lens of the video camera. The analog output of the video camera is digitized, and the digital signal is provided to a processor which performs an analysis to provide a parameter indicative of the roughness of the surface.

REFERENCES:
patent: 3805035 (1974-04-01), Serra
patent: 4476489 (1984-10-01), Weltlich et al.
patent: 4513316 (1985-04-01), Kobayashi et al.
patent: 4617682 (1986-10-01), Mori et al.
patent: 4667231 (1987-05-01), Pryor
Luk F., Huynh V. and North W., "Measurement of Surface Roughness by a Vision System", Proc. of ASME Computers in Engineering, 1987 Conf., vol. 2, Aug. 9-13, 1987, pp. 61-65, (N.Y.).
F. Luk and V. Huynh, "Vision System for In-Process Surface Quality Assessment", Proceedings of Vision '87 Conf., Jun. 8-11, 1987, Detroit, MI., pp. 12-43 to 12-58.
F. Luk, V. Huynh, W. North, "Application of Spatial Spectral Analysis to In-Line Machine Inspection of Surface Roughness", Proceedings of the IXth ICPR Conf., vol. I, Aug. 17-20, 1987, Cincinnati, Ohio, pp. 450 to 460.
Van-Minh Huynh and William Hugh Miller, "A New Optical Method for the Measurement of Roughness of Paper Surfaces", Proceedings of the SID, vol. 28/84, 1987, pp. 471 to 475.

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