Method and apparatus for arc suppression in scanned ion beam...

Electricity: electrical systems and devices – Safety and protection of systems and devices – Arc suppression at switching point

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S003000, C361S009000, C361S011000

Reexamination Certificate

active

07345856

ABSTRACT:
In an ion bean acceleration system, transient electrical arc suppression and ion beam accelerator biasing circuitry. Two-terminal circuitry, connectable in series, for suppressing arcs by automatically sensing arc conditions and switch from at least a first operating state providing a relatively low resistance electrical pathway for current between source and load terminals to at least a second, relatively high resistance electrical pathway. Selection of circuit component characteristics permits controlling the delay in returning from the second state to the first state after the arc has been suppressed.

REFERENCES:
patent: 4152744 (1979-05-01), Pang
patent: 5162965 (1992-11-01), Milberger et al.
patent: 6577479 (2003-06-01), Springer et al.
patent: 36 30 775 (1991-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for arc suppression in scanned ion beam... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for arc suppression in scanned ion beam..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for arc suppression in scanned ion beam... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3961258

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.