Method and apparatus for applying bias to a storage device

Details Method and apparatus for applying bias to a storage device Method and apparatus for applying bias to a storage device

2007-07-03

2007-07-03

Mai, Son L. (Department: 2827)

Static information storage and retrieval

Floating gate

Particular connection

C365S185110, C365S200000, C365S226000, C365S227000

Reexamination Certificate

active

11317082

ABSTRACT:
In Step1, a bias is applied (ON) to all of vertical rows Z1(0) to Z1(2). With respect to the horizontal rows, a bias is not applied (OFF) to a horizontal row Z2(0) where the defective sector exists and a bias is applied (ON) to the other horizontal rows Z2(1) and Z2(2). On the sectors in the horizontal rows Z2(1) and Z2(2), a voltage stress is applied and an access operation is performed. In Step2, with respect to the vertical rows, a bias is not applied (OFF) to a vertical row Z1(1) where the defective sector exists and a bias is applied (ON) to the other vertical rows Z1(0) and Z1(2). With respect to the horizontal rows, a bias is applied (ON) to the horizontal row Z2(0) where the defective sector exists, and no bias is applied (OFF) to the other horizontal rows Z2(1) and Z2(2). As for the two steps, a voltage stress can be applied once to the sectors other than the defective sector.

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