Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1998-10-02
2000-03-14
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
702118, 702121, 702123, G06F 1100, H01L 2166
Patent
active
060385200
ABSTRACT:
A method and apparatus for testing specific assembled circuits begins by configuring a plurality of applications specific testing entities to test assembled circuits, where the configuring is based on the types of assembled circuits being tested. Next, a specific assembled circuit testing program is provided to the corresponding application specific testing entity based on the type of assembled circuits it is testing. In addition to providing the testing programs to the testing entities, programming instructions are provided to a programmable handler to pick and place the appropriate assembled circuits with the corresponding applications specific testing entities. When the testing of a particular assembled circuit is complete, a test complete indication is provided. When the test complete indication is received by the host, programming instructions are provided to the programmable handler to remove the integrated circuit from the testing entity and place another integrated circuit in the proximity of the testing entity for subsequent testing.
REFERENCES:
patent: 5278976 (1994-01-01), Wu
patent: 5371748 (1994-12-01), Saw et al.
patent: 5499340 (1996-03-01), Barritz
patent: 5726920 (1998-03-01), Chen et al.
Ho Sam
Lau Lee
Man Albert
Schoonover Roy
ATI Technologies Inc
Bui Bryan
Hoff Marc S.
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