Method and apparatus for application's specific testing of assem

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

702118, 702121, 702123, G06F 1100, H01L 2166

Patent

active

060385200

ABSTRACT:
A method and apparatus for testing specific assembled circuits begins by configuring a plurality of applications specific testing entities to test assembled circuits, where the configuring is based on the types of assembled circuits being tested. Next, a specific assembled circuit testing program is provided to the corresponding application specific testing entity based on the type of assembled circuits it is testing. In addition to providing the testing programs to the testing entities, programming instructions are provided to a programmable handler to pick and place the appropriate assembled circuits with the corresponding applications specific testing entities. When the testing of a particular assembled circuit is complete, a test complete indication is provided. When the test complete indication is received by the host, programming instructions are provided to the programmable handler to remove the integrated circuit from the testing entity and place another integrated circuit in the proximity of the testing entity for subsequent testing.

REFERENCES:
patent: 5278976 (1994-01-01), Wu
patent: 5371748 (1994-12-01), Saw et al.
patent: 5499340 (1996-03-01), Barritz
patent: 5726920 (1998-03-01), Chen et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for application's specific testing of assem does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for application's specific testing of assem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for application's specific testing of assem will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-178630

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.