Method and apparatus for analyzing the state of polarization of

Details Method and apparatus for analyzing the state of polarization of Method and apparatus for analyzing the state of polarization of

1980-02-21

1982-01-12

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With birefringent element

356351, G01B 902

Patent

active

043102476

ABSTRACT:
A radiation analyzing system including a beam splitting prism, an analyzer and a photodiode array arranged in an evaluation plane. Upon passing through the prism radiation to be analyzed is split into two beams vertically linearly polarized to each other which include a small angle and show a phase shift that is a function of the distance from the optical axis. The difference of the phase positions of these two beams is a function of their distance from the left or right edge of the prism. The analyzer, which is arranged behind the prism and whose axis of polarization is inclined relative to the directions of polarization of the two vertically polarized beams, produces a periodic intensity distribution when the impinging radiation is polarized at least partly and has a component in parallel to the axis of the analyzer. The periodicity of the intensity distribution which generally consists of an interference fringe pattern in evaluation plane is proportional to the wave length of the light and inversely proportional to the sine of the splitting angle of the prism. This intensity distribution is detected by the one-dimensional photodiode array arranged in the evaluation plane, and subsequently applied either to suitable analog circuits or to a computer for evaluation.

REFERENCES:
patent: 3694088 (1972-09-01), Gallagher et al.
patent: 3700334 (1972-10-01), Low et al.
patent: 4166954 (1979-09-01), Goranson
Francon et al., Polarization Interferometers, John Wiley & Sons, 1971 pp. 45-46, 50-51, 127-129.
Born et al., Principles of Optics, Pergamon Press, 1959, pp. 301-302.

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