Method and apparatus for analyzing sludgy materials

Details Method and apparatus for analyzing sludgy materials Method and apparatus for analyzing sludgy materials

1991-03-25

1992-04-21

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 47, G01N 23223

Patent

active

051075270

ABSTRACT:
Analyzing sludgy materials by exposing the flowing material in continuous action to x-ray radiation and by measuring the radiation thus created in the said material, according to the invention, the radiation emitted from the material is measured with respect to the intensities of both x-ray fluorescence radiation and x-ray diffraction radiation, and these intensities are combined in order to form a parameter which describes the proportions of the partial components in a given compound combination. Moreover, the detectors employed in the measurement of the radiation intensities are placed at the same cross-sectional plane of the analyzer.

REFERENCES:
patent: 4134012 (1979-01-01), Smallbone
Nicol, A. W., Editor for "Physicochemical Methods of Mineral Analysis", Chapter 6, pp. 231-247, Plenum, N.Y. and London 1975.

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