Telephonic communications – Diagnostic testing – malfunction indication – or electrical... – Testing of subscriber loop or terminal
Patent
1995-05-02
1997-02-25
Kuntz, Curtis
Telephonic communications
Diagnostic testing, malfunction indication, or electrical...
Testing of subscriber loop or terminal
379 5, 379 6, 379 24, 379 26, 379 27, H04M 124, H04M 308, H04M 322
Patent
active
056065922
ABSTRACT:
Resistive faults are analyzed on a conductor in a telephone line by first charging the conductor to an initial voltage. The conductor is allowed to float for a finite amount of time, allowing some of the charge on the conductor to leak through any resistive fault. Then, the voltage of the conductor is measured and compared to the initial voltage. Loss of voltage indicates a resistive fault. This information can be used to provide an indication of the accuracy of a capacitance measurement and can be used to correct the capacitance measurement to account for the error due to the resistive fault.
REFERENCES:
patent: Re30692 (1981-07-01), Ellson
patent: 3891895 (1975-06-01), Wittlinger
patent: 4022990 (1977-05-01), Bauer
patent: 4028507 (1977-06-01), Hoppough
patent: 4032841 (1977-06-01), Knippelmier
patent: 4144487 (1979-03-01), Pharney
patent: 4320338 (1982-03-01), Morris
patent: 4396809 (1983-08-01), Brunssen
patent: 4399402 (1983-08-01), Pelletier
patent: 4514694 (1985-04-01), Finger
patent: 4820991 (1989-04-01), Clark
patent: 4845737 (1989-07-01), Ohlendorf
patent: 4868507 (1989-09-01), Reed
patent: 4882742 (1989-11-01), Kaiser
patent: 4947469 (1990-08-01), Vokey et al.
patent: 5029274 (1991-07-01), Goff et al.
patent: 5083086 (1992-01-01), Steiner
patent: 5144252 (1992-09-01), Walsworth et al.
patent: 5222119 (1993-06-01), Asano
patent: 5444759 (1995-08-01), Vogt
Galloway George G.
Siglinger Paul R.
Industrial Technology Inc.
Kuntz Curtis
Mantooth Geoffrey A.
Shankar Vijay
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