Method and apparatus for analyzing interactions between workload

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39518401, 39518313, 371 221, G06F 9455

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057269130

ABSTRACT:
A locality characteristic generator and a response surface characteristic generator are provided either jointly or separately to one or more computer systems for generating locality characteristic data for workloads, and response surface characteristic data for locality dependent subsystem, independent of each other, which in turn are used to generate independent locality and response surface characteristic profiles. Each locality characteristic profile reflects the probability that the first occurrence of an access to a location with a stride of size s from the current location takes place between the reference distance of d/2 to d from the current reference. Each response surface characteristic profile reflects what the expected response time will be if the first occurrence of an access to a location having a stride of size s from the current location takes place between the reference distance of d/2 to d from the current reference. Accordingly, any one of the locality characteristic profiles can be used in conjunction with any one of the independent response surface characteristic profiles to analyze the interaction between the particular combination of workload and locality dependent subsystem. Alternatively, the generated locality and response characteristic data can be used to generate performance indices for various combinations of workloads and locality dependent subsystems.

REFERENCES:
patent: 5446876 (1995-08-01), Levine et al.
patent: 5452440 (1995-09-01), Salsburg
patent: 5574937 (1996-11-01), Narain
Grimsrud et al., "BACH: a hardware monitor for tracing microprocessor-based systems", Oct. 1993.
Grimsrud, K., Quantifying Locality, Ph.D. Dissertation, Brigham Young University, 1993.

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