Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1989-09-21
1992-12-22
Williams, Hezron E.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
73 1901, G01N 3300
Patent
active
051725819
ABSTRACT:
Fluids entrapped in small confined within spaces of an object are analyzed by securing the object containing the confined space by epoxy to a small fitting over a notch applied on the object's surface adjacent to the confined space, the fitting being a slidable seal attached to a small tube which has a piercing device adapted to move with the small tube relative to the fitting and the object containing the confined space to puncture same through the notch, whereby the entrapped gaseous fluid in the confined space emerges into the fitting and small tube, the entire system being a sealed enclosure. Attached to the small tube is a capillary which leads to an analyzing device, such as a mass spectrometer. The small tube fitting and capillary are sufficiently small in volume and configured so that gaseous fluid from the now ruptured confined space flows in a viscous condition from the object to the analyzing device and is in contact with minimal surface area to minimize any adsorption effects which would change the contents of the fluid sample. No elastomer O-rings or other materials known for their adsorption affinities insofar as substances of interest in the contents of the fluid emerging from the confined space are used. A heated chamber may receive the object having the confined space, the small tube including the penetrating device attached thereto and the capillary tube. One valve connected to the tube is provided for purging the system and for admitting calibration gases from an appropriate gas handling system. Confined spaces of interest may be in electronic devices, glasses as well as other solids which entrap fluids that it is desired to analyze.
REFERENCES:
patent: 4711118 (1987-12-01), Bossard et al.
Bijawat Sanjai K.
Brackmann Richard T.
Myers Richard L.
Extrel Corporation
Roskos Joseph W.
Williams Hezron E.
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