Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-04-05
2005-04-05
Pert, Evan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06876210
ABSTRACT:
A method of analyzing electromagnetic interference in which an amount of electromagnetic interference from an LSI is analyzed, wherein the method includes: an equivalent power source current information calculating step of calculating information of an equivalent power source current flowing in a power source current, from circuit information of the LSI chip; an estimating step of considering at least one of power source information of a power source for supplying a current to the LSI chip, package information of a package for the semiconductor chip, and measurement system information of a measurement system for measuring characteristics of the semiconductor chip, as analysis control information, and of estimating total information in which the analysis control information is reflected in the circuit information, as an equivalent circuit; and a total information analyzing step of performing analysis in accordance with the total information which is estimated in the estimating step.
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“EMI-Noise Analysis under ASIC Design Environment”, Sachio Hayashi et al., ISPD 1999, Monterey, California, pp. 16-23.
Hirano Shouzou
Mizokawa Takashi
Ohhashi Tatsuo
Shimazaki Kenji
Tsujikawa Hiroyuki
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Nguyen Tung X.
Pert Evan
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