Method and apparatus for analyzing current in an integrated...

Details Method and apparatus for analyzing current in an integrated... Method and apparatus for analyzing current in an integrated...

2007-05-16

2008-11-18

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120

Reexamination Certificate

active

07453273

ABSTRACT:
Method and apparatus for analyzing current in an integrated circuit under test is described. In one example, an image from detected photon emissions from the integrated circuit is generated. A first intensity of the photon emissions at a first region in the image indicative of a first current having a known magnitude is determined. A second intensity of the photon emissions at a second region in the image indicative of a second current is determined. A magnitude of the second current is estimated from the first intensity, the second intensity, and the known magnitude of the first current.

REFERENCES:
patent: 5301006 (1994-04-01), Bruce
patent: 6344750 (2002-02-01), Lo et al.
patent: 6870379 (2005-03-01), Davis et al.

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