Television – Special applications – Manufacturing
Patent
1996-05-31
1998-09-29
Chin, Tommy P.
Television
Special applications
Manufacturing
348 91, 348 92, 348125, 348128, 382141, H04N 718
Patent
active
058151982
ABSTRACT:
The Invention includes a method and apparatus which analyzes an image of an object to detect and identify defects in the object. The present invention utilizes a scanning technique which converts a 2-D image of the object into a 1-D image, a transformation technique which extracts relevant features from the image, and a fuzzy inferencing technique which utilizes the features generated by the transformation technique to detect and identify defects. The present invention preferably includes an off-line learning process which selects the optimum transform coefficients for a given set of defects and stores the corresponding features in a rulebase. Preferably, the wavelet transform is used as the transformation technique to provide an analysis of the image which is localized in the frequency and time domains. The present invention may also include an on-line learning process when the present invention is incorporated into a manufacturing process for real time inspection of the object being manufactured. The on-line learning process attempts to nullify the effects of noise which may be associated with the image sensors being used to read the image by using a similarity function to maintain a predetermined level of fuzziness of the inference engine of the present invention.
REFERENCES:
patent: 3781117 (1973-12-01), Laycak et al.
patent: 3803420 (1974-04-01), Bossons
patent: 3972624 (1976-08-01), Klein et al.
patent: 4110048 (1978-08-01), Akutsu et al.
patent: 4173441 (1979-11-01), Wolf
patent: 4298808 (1981-11-01), Hill
patent: 4903528 (1990-02-01), Balakrishnan et al.
patent: 4953400 (1990-09-01), Bossuyt
patent: 5073964 (1991-12-01), Resnikoff
patent: 5345515 (1994-09-01), Nishi et al.
patent: 5457539 (1995-10-01), Sturm
patent: 5471991 (1995-12-01), Shinnar
patent: 5497430 (1996-03-01), Sadovnik et al.
patent: 5513275 (1996-04-01), Khalaj et al.
patent: 5544256 (1996-08-01), Brecher et al.
patent: 5548120 (1996-08-01), Parker et al.
patent: 5631970 (1997-05-01), Hsu
Zadeh, L.A., "Fuzzy Sets," Information and Control 8, pp. 338-353, 1965.
Thyagarajan, K.S. and Chatterjee, S., "Fractal Scanning for Image Compression," Conference Record of The Twenty-Fifth Asilomar Conference on Signals, Systems & Computers, vol. 1 p. 467-471 1991.
Xuecheng, L., "Entropy, distance measure and similarity measure of fuzzy sets and their relations," Fuzzy Sets and Systems 52, pp. 305-318, 1992.
Phuvan, S., Oh, T.K., Caviris, N., Li, Y. and Szu, H, "Optoelectronic Fractal Scanning Technique for Wavelet Transform and Neural Net Pattern Classifiers" International Joint Conference on Neural Networks, pp. I-40-6, Jun. 7-11, 1992.
Szu, H.H. Telfer, B. and Kadambe, S., "Neural network adaptive wavelets for signal representation and classification," Optical Engineering, vol. 31, No. 9, pp. 1907-1916, Sep. 1992.
Kang, H. and Vachtsevanos, G., "Fuzzy Hypercubes: Linguistic Learning/Reasoning Systems for Intelligent Control and Identification," Journal of Intelligent and Robotic Systems 7, pp. 215-243, 1993.
Bakshi, B.R., Koulouris, A. and Stephanopoulos, G., "Wave-Nets: novel learning techniques, and the induction of physically interpretable models," The International Society for Optical Engineering, vol. 2242, pp. 637-648, 1994.
Mufti, M. and Vachtsevanos, G., "An Intelligent Approach to Fault Detection and Identification," Proceedings of the 1995 American Control Conference, vol. 3, pp. 1621-1622, Jun. 1995.
Kang, H. and Vachtsevanos, G., "Fuzzy Hypercubes: A Possibilistic Inferecning Paradigm," IEEE Conf. on Fuzzy Systems, vol. 1, pp. 553-560, 1992.
Kang, H. and Vachtsevanos, G.J., "Model Reference Fuzzy Control," Proc. of 27th IEEE Conf. on Decision and Control, pp. 751-756, Dec. 1989.
Dorrity J. Lewis
Mufti Muid
Vachtsevanos George J.
Chin Tommy P.
Le Vu
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