Method and apparatus for analyzing a gas sample

Radiant energy – Ionic separation or analysis – With sample supply means

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Details

250292, 250282, B01D 5944, H01J 4900

Patent

active

054122074

ABSTRACT:
A method and gas analysis system for a mass spectrometer including an ion pump for creating an internal vacuum within said mass spectrometer, an ionization chamber, an inlet passage through which a gas sample is introduced into the ionization chamber, valve means associated with the inlet passage for controlling the volume of gas sample introduced into the ionization chamber, a filament for introducing electrons into the ionization chamber whereby the electrons bombard the gas sample thus forming ions, an extractor plate positioned adjacent the ionization chamber and biased such that a proportion of ions and electrons are allowed to pass through the extractor plate, a quadrupole filter into which the ions and electrons are directed by the extractor plate, the quadrupole filter operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter and ions other than those having the pre-selected mass-to-charge ratio being separated from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter so that the electrons combine with the ions, a sensor for detecting the stream of ions passing through the quadrupole filter, and analyzing means connected with the sensor for analyzing the components of the gas sample.

REFERENCES:
patent: 3560734 (1971-02-01), Barnett et al.
patent: 3895231 (1975-07-01), Sodal et al.
patent: 3926209 (1975-12-01), Sodal et al.
patent: 3996464 (1976-12-01), Fletcher et al.
patent: 4008388 (1977-02-01), McLafferty et al.
patent: 4018241 (1977-04-01), Sodal et al.
patent: 4134013 (1979-01-01), Evans et al.
patent: 4134073 (1979-01-01), MacGregor
patent: 4689574 (1987-08-01), Lim
patent: 4731533 (1988-03-01), Vestal
patent: 4746794 (1988-05-01), French et al.
patent: 4746802 (1988-05-01), Kellerhals
patent: 4755671 (1988-07-01), Freidland et al.
patent: 4769540 (1988-09-01), Mitsui et al.
patent: 4816685 (1989-03-01), Lange
patent: 4870283 (1989-09-01), Taya
patent: 4947041 (1990-08-01), Taya
patent: 4948962 (1990-08-01), Mitsui et al.
patent: 5153432 (1992-10-01), Devant et al.

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