Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-03-21
2006-03-21
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S180000, C702S182000, C702S069000, C375S226000, C375S371000
Reexamination Certificate
active
07016805
ABSTRACT:
A method, apparatus, and article of manufacture for analyzing a measurable distribution having random components and deterministic components. The method includes the steps of collecting data, constructing a probability density function based on the data such that the probability density function is a convolution of deterministic functions and random functions, constructing a probability density function based on a deterministic and random convolution model having three or more parameters wherein at least one of the parameters are unknown, and determining unknown parameters by using a deconvolution process.
REFERENCES:
patent: 4539518 (1985-09-01), Kitayoshi
patent: 5057992 (1991-10-01), Traiger
patent: 5452333 (1995-09-01), Guo et al.
patent: 5495409 (1996-02-01), Kanno
patent: 5572125 (1996-11-01), Dunkel
patent: 5748491 (1998-05-01), Allison et al.
patent: 5751852 (1998-05-01), Marimont et al.
patent: 5761254 (1998-06-01), Behrin
patent: 5987444 (1999-11-01), Lo
patent: 6028895 (2000-02-01), Dinsel et al.
patent: 6278730 (2001-08-01), Tsui et al.
patent: 6278961 (2001-08-01), Kadtke et al.
patent: 6298315 (2001-10-01), Li et al.
patent: 6622117 (2003-09-01), Deligne et al.
patent: 6799144 (2004-09-01), Li et al.
patent: 6832172 (2004-12-01), Ward et al.
patent: 6853933 (2005-02-01), Tan et al.
patent: 6888457 (2005-05-01), Wilkinson et al.
patent: 2001/0036228 (2001-11-01), Skafidas et al.
patent: 2001/0044704 (2001-11-01), Li et al.
patent: 2002/0003843 (2002-01-01), Martone
patent: 2002/0188429 (2002-12-01), Martis
patent: 2003/0004664 (2003-01-01), Ward et al.
patent: 2003/0115017 (2003-06-01), Sun et al.
patent: 2004/0001194 (2004-01-01), Wilstrup et al.
patent: 2004/0019458 (2004-01-01), Jang
patent: 2004/0136450 (2004-07-01), Guenther
patent: 2005/0027477 (2005-02-01), Li et al.
patent: 2005/0080574 (2005-04-01), Draving
patent: 2005/0111536 (2005-05-01), Cranford et al.
Li Peng
Sun Jie
Wilstrup Jan Brian
Merchant & Gould P.C.
Tsai Carol S. W.
Wavecrest Corporation
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