Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-08-30
2011-08-30
Nguyen, Tu (Department: 2886)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
08009894
ABSTRACT:
The invention relates to methods for analysis of particles in a liquid sample, the sample being retained in a sample retaining device, the method comprising: acquiring, by means of an image acquiring device, a plurality of images of said sample at different focus planes within the sample retaining device; analysing said images, by means of an image analyser, for identifying which, if any, of the particles of the sample are imaged in focus in each of the images, and analysing those particles which have been identified as being imaged in focus; wherein said plurality of images are acquired at different, essentially parallel, focus planes, which planes are separated from each other by a distance, said distance being less than 10 micrometers. The invention also relates to apparatuses adapted to be used for the inventive methods.
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PI News/Press Release for NEXACT®: Novel Compact OEM Piezo Stepping Motor/Actuator with Long Travel Range; Aug. 2007; http://www.physikinstrumente.com/en
ews/fullnews.php?newsid=123&Wiki—iw.
Lindberg Stellan
Olesen Tom
Valvik Martin
Buchanan & Ingersoll & Rooney PC
Hemocue AB
Nguyen Tu
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