Method and apparatus for analog-to-digital pipeline conversion

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion

Reexamination Certificate

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C341S150000

Reexamination Certificate

active

06801151

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates generally to electronic circuits and, more particularly, to a method and apparatus for analog-to-digital pipeline conversion.
BACKGROUND OF THE INVENTION
An N-bit algorithmic analog-to-digital (A/D) converter, either a pipeline or cyclic converter, generally includes a predetermined number J of conversion stages, each conversion stage being a K-bit stage, where J×K=N.
FIG. 1
is a block diagram illustrating a prior art conversion stage of a pipeline analog-to-digital (A/D) converter. As illustrated in
FIG. 1
, the conversion stage
100
includes a sample/hold S/H module
110
to receive an analog input voltage V
RESi−1
105
, a K-bit A/D subconverter module ADSC
120
coupled to an output of the S/H module
110
to estimate the analog input voltage V
RESi−1
105
into a digital signal
125
by extracting a predetermined number K of bits from the V
RESi−1
105
, and a K-bit digital-to-analog (D/A) converter DAC
130
coupled to the ADSC
120
to receive the K-bit signal
125
from the ADSC
120
and to create an analog estimate V
DACi
135
of the input voltage V
RESi−1
105
. A summing circuit
140
coupled to the S/H module
110
and to the DAC
130
subsequently subtracts the analog estimate V
DACi
135
from the analog input voltage V
RESi−1
105
and transmits the resulting analog residue voltage
145
to an amplifier module A
V
150
. The A
V
150
amplifies the residue voltage
145
by a 2
K
factor to obtain an amplified residue voltage V
RESi
155
and transmits the voltage V
RESi
155
to a subsequent conversion stage (not shown) of the A/D converter. The amplified residue voltage
155
can be calculated with the formula
V
RESi
=2
K
×V
RESi−1
−V
DACi
In any algorithmic A/D converter, the overall linearity of the converter is generally determined by the linearity of the DAC
130
of each conversion stage
100
. Thus, a solution designed especially for high linearity and high speed applications uses K=1 and a 1-bit ADSC
120
and DAC
130
. With a single-bit decision, there is always a straight line that can be drawn between the positive and negative reference voltages. In this case, the ideal gain of the conversion stage
100
is 2 and the residue equation becomes
V
RESi
=2
×V
RESi−1
−V
DACi
FIG. 2
is a schematic diagram illustrating a prior art analog residue computation circuit. As illustrated in
FIG. 2
, the circuit
200
combines the S/H module
110
, the ADSC
120
, the DAC
130
, and the summing circuit
140
shown in the conversion stage of
FIG. 1
into a single switched capacitor circuit
200
.
During a first phase of a non-overlapping clock, known as the sample phase, a switch S
1C
222
holds operational amplifier
223
as a voltage follower and the analog input voltage V
RESi−1
105
minus the offset of the operational amplifier
223
is sampled on both capacitors
211
and
212
through switches S
1A
201
and S
1B
202
, respectively.
During a second phase of the non-overlapping clock, known as the hold phase, the bottom plate of the capacitor
211
is coupled to the output of the operational amplifier
223
through switch S
2B
221
and the bottom plate of the capacitor
212
is coupled to D
i
×V
REF
through switch S
2A
203
, where the data D
i
is the data input and can take one of two values, −1 or +1, at any given pipeline stage.
The speed of the pipeline A/D converter is determined by the speed of a single conversion stage
100
illustrated in FIG.
1
. The alternating conversion stages
100
of the converter work on alternating phases of the clock, such that, in any phase, half of the conversion stages
100
are in the hold phase and half are in the sample phase. Thus, for correct functionality, the sample phase of one conversion stage
100
must end after the residue voltage transmitted from the previous conversion stage
100
(in hold phase), for example, the analog residue voltage V
RESi−1
105
in
FIG. 1
, has settled to its final value. Otherwise, for example, if the conversion clock is too fast, the residue value transferred to the next conversion stage
100
will be incorrect. As a result, high speed converters require conversion stages
100
with fast settling times.
For switched capacitor implementations, such as the circuit
200
illustrated in
FIG. 2
, assuming a single dominant-pole operational amplifier
223
, the settling time to within N bits of accuracy is determined by the formula
T
S
=N×ln
(2)×
C
L
/&bgr;×g
M
where g
M
/C
L
is the dominant pole of the operational amplifier
223
and &bgr; is the feedback factor (feedback gain). Thus, for high speed converters having small feedback factor &bgr;, what is needed is a method and apparatus that minimizes the settling time.
Another perceived limitation of the high speed pipeline A/D converters is the comparator ADSC
120
decision time.
FIG. 3
is a timing diagram illustrating the timing of two consecutive prior art conversion stages of a pipeline A/D converter. As shown in
FIG. 3
, after the end of the sample phase, the conversion stage
100
has to execute first a compare phase. The settling phase of the operational amplifier
223
cannot start before the completion of the compare phase because there is no information about the region of the residue voltage conversion. On the other hand, the compare phase has to have a correct input; therefore it has to wait for the previous conversion stage to settle. Thus, what is needed is a method and apparatus in which the comparator decision time is not a major limitation on the conversion clock at high speeds.
SUMMARY OF THE INVENTION
A method and apparatus for analog-to-digital pipeline conversion are described. The apparatus includes a sample/hold circuit having an input to receive an analog input voltage, a comparator device coupled to the input of the sample/hold circuit to receive the analog input voltage, and a separate gain circuit coupled to an output of the sample/hold circuit and to the comparator device. The sample/hold circuit and the comparator device sample the analog input voltage and the separate gain circuit amplifies an analog residue voltage obtained from the analog input voltage to obtain an amplified analog residue voltage in a first phase of a non-overlapping clock. The analog residue voltage is obtained in a second phase of the non-overlapping clock, when the sample/hold circuit holds the analog input voltage sampled in the first phase, and the comparator device compares the analog input voltage sampled in the first phase with a reference voltage value.
Other features and advantages of the present invention will be apparent from the accompanying drawings, and from the detailed description, which follows below.


REFERENCES:
patent: 4611196 (1986-09-01), Fernandez
patent: 5995035 (1999-11-01), Signell et al.
patent: 6313779 (2001-11-01), Leung et al.
patent: 6606042 (2003-08-01), Sonkusale et al.

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