Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-12-06
2005-12-06
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S059000, C702S120000, C714S718000, C365S201000
Reexamination Certificate
active
06973404
ABSTRACT:
A method and apparatus permits use of a tester memory (31) as storage for an inversion mask. The inversion mask indicates to the tester which cells in a DUT memory (14) are logically inverted during testing. Data information and the inverse of the data information is input into a first data multiplexer (802). The stored inversion mask (902–908) is used to independently select a data information bit or its inverse for presentation as a masked output (814) at the output of the first data multiplexer (802).
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Freeseman John M
Krech, Jr. Alan S
Agilent Technologie,s Inc.
Bouscaren June L.
Hoff Marc S.
West Jeffrey R
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