Method and apparatus for administering inversion property in...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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C702S059000, C702S120000, C714S718000, C365S201000

Reexamination Certificate

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06973404

ABSTRACT:
A method and apparatus permits use of a tester memory (31) as storage for an inversion mask. The inversion mask indicates to the tester which cells in a DUT memory (14) are logically inverted during testing. Data information and the inverse of the data information is input into a first data multiplexer (802). The stored inversion mask (902–908) is used to independently select a data information bit or its inverse for presentation as a masked output (814) at the output of the first data multiplexer (802).

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patent: 5185744 (1993-02-01), Arimoto et al.
patent: 5604913 (1997-02-01), Koyanagi et al.
patent: 5668819 (1997-09-01), Fukushima
patent: 5717701 (1998-02-01), Angelotti et al.
patent: 5901155 (1999-05-01), Proulx
patent: 6246971 (2001-06-01), Kermani et al.
patent: 6295620 (2001-09-01), Togo

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