Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-01-22
1997-02-11
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324699, 324701, 324704, 204206, G01R 2714
Patent
active
056024886
ABSTRACT:
Methods of measuring, adjusting and uniformalizing a sectional area ratio of a metal-covered electric wire, a method of cleaning an electric wire, a method of manufacturing a metal-covered electric wire, an apparatus for measuring a sectional area ratio of a metal-covered electric wire, and an apparatus for electropolishing a metal-covered electric wire.
Electric resistance values of first and second materials are previously stored respectively so that a sectional area ratio of a metal-covered electric wire is calculated on the basis of the as-stored values and an actually measured electric resistance value of the metal-covered electric wire. Measurement and uniformalization of a sectional area ratio of a metal-covered electric wire and cleaning of an electric wire are carried out by dissolving surface layer parts of the electric wires by electropolishing.
REFERENCES:
patent: 2008046 (1935-07-01), Snelling
patent: 2854626 (1958-09-01), Davidson
patent: 3735254 (1973-05-01), Severin
patent: 3936738 (1976-02-01), Maltby
patent: 4667149 (1987-05-01), Cohen
Koganeya Masanobu
Mikumo Akira
Takahashi Ken'ichi
Solis Jose M.
Sumitomo Electric Industries Ltd.
Wieder Kenneth A.
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