Method and apparatus for adjusting defect signal gate in ultraso

Details Method and apparatus for adjusting defect signal gate in ultraso Method and apparatus for adjusting defect signal gate in ultraso

1977-03-09

1978-05-09

Ruehl, Charles A.

Measuring and testing

Vibration

By mechanical waves

73624, G01N 2904

Patent

active

040880281

ABSTRACT:
In an ultrasonic pulse-echo test circuit a probe means is coupled via a liquid filled coupling path to a workpiece which undergoes motion relative to the probe means. For each search signal transmitted by the probe means the transit time of such signal is measured from the time of transmission by the probe means to the receipt of the workpiece rear surface responsive echo signal. A computer coupled to receive the transit time values is programmed to classify transit time changes as fast occurring changes, caused by changes in coupling path length, or as slow occurring changes, caused by workpiece thickness changes. A defect gate forming a part of the test circuit is controlled by adjusting its opening responsive to a change in coupling path length and its closing responsive to a workpiece thickness change.

REFERENCES:
patent: 3646805 (1972-03-01), Walters
patent: 3942358 (1976-03-01), Pies
patent: 3986389 (1976-10-01), Mesina et al.

Affiliated with

Also associated with

Rating

Method and apparatus for adjusting defect signal gate in ultraso does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for adjusting defect signal gate in ultraso, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for adjusting defect signal gate in ultraso will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2351388