Electric lamp or space discharge component or device manufacturi – Process – With testing or adjusting
Reexamination Certificate
2005-05-10
2005-05-10
Williams, Joseph (Department: 2879)
Electric lamp or space discharge component or device manufacturi
Process
With testing or adjusting
C445S006000
Reexamination Certificate
active
06890229
ABSTRACT:
A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more times according to a characteristic of the electron-emitting device, wherein the voltage for adjustment is selected from a plurality of voltages having discrete values according to the characteristic of the electron-emitting device, and a number of applying times of the pulse is determined according to the characteristic of the electron-emitting device and the selected voltage.
REFERENCES:
patent: 5591061 (1997-01-01), Ikeda et al.
patent: 5998924 (1999-12-01), Yamamoto et al.
patent: 6144350 (2000-11-01), Fujii et al.
patent: 6149480 (2000-11-01), Iwasaki et al.
patent: 6184851 (2001-02-01), Yamaguchi et al.
patent: 6231412 (2001-05-01), Kawade et al.
patent: 6409563 (2002-06-01), Tamura et al.
patent: 6473063 (2002-10-01), Suzuki et al.
patent: 6490433 (2002-12-01), Kawade
patent: 6621475 (2003-09-01), Yamaguchi et al.
patent: 6661179 (2003-12-01), Aoki et al.
patent: 20020039870 (2002-04-01), Kaneko et al.
patent: 20020122018 (2002-09-01), Kanda et al.
patent: 20030057850 (2003-03-01), Aoki et al.
patent: 0 803 892 (1997-10-01), None
patent: 8-96700 (1996-04-01), None
patent: 10-228867 (1998-08-01), None
patent: 2000-243256 (2000-09-01), None
Aoki Shuji
Oguchi Takahiro
Fitzpatrick ,Cella, Harper & Scinto
Williams Joseph
LandOfFree
Method and apparatus for adjusting characteristics of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for adjusting characteristics of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for adjusting characteristics of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3394334