Method and apparatus for adjusting a sample-ion source...

Details Method and apparatus for adjusting a sample-ion source... Method and apparatus for adjusting a sample-ion source...

2011-01-18

2011-01-18

Berman, Jack I (Department: 2881)

Radiant energy

Ionic separation or analysis

With sample supply means

C250S281000, C250S282000, C250S286000, C250S287000

Reexamination Certificate

active

07872226

ABSTRACT:
In a time-of-flight mass spectrometer having an ion source with a first accelerating electrode, a distance between the surface of a sample and the first accelerating electrode is maintained at a predetermined distance which is critical for determining the mass and quantity of ions generated by the ion source. A digital image of the sample surface is obtained with a digital camera and a predetermined characteristic of the digital image is determined. The predetermined characteristic is then used to compute an adjustment amount by which the sample surface is moved to maintain the predetermined distance. Determining the predetermined characteristic can be simplified by projecting a light pattern onto the sample surface at an angle and determining the predetermined characteristic from the digital image of the pattern.

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