Method and apparatus for addressing and testing more than two AT

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

395427, 371 211, 304239, 3042217, 3042384, 361685, G06F 1100

Patent

active

056447051

ABSTRACT:
A method and apparatus for addressing a plurality of AT Attachment, Integrated Drive Electronics (ATA/IDE) disk drive assemblies from a single PC/AT thereby allowing the performance of manufacturing tests on multiple IDE drives using the ISA bus. Other drive assemblies are address during the substantial PC/AT CPU and I/O idle time available during the testing of a selected drive assembly. The system includes a PC/AT computer having an ISA bus, a plurality of ATA/IDE disk drives, and a multi-master card disposed between the PC/AT and the plurality of disk drives. The multi-master card includes an IDE controller card with a parallel port. Signals are generated to select one of the plurality of disk drives and ISA bus signals are routed to the selected disk drives. All the disk drives are disabled but the selected disk drive and a three bit signal line is used to select the disk drive for testing. Test capabilities are provided for in a standard, local, and remote mode of operation. The addressing scheme allows all drives to be addressed as master drives and each master on the bus can have a slave attached.

REFERENCES:
patent: 4268905 (1981-05-01), Johann et al.
patent: 4348761 (1982-09-01), Berger
patent: 4641207 (1987-02-01), Green et al.
patent: 4725968 (1988-02-01), Baldwin et al.
patent: 4747047 (1988-05-01), Coogan et al.
patent: 4885683 (1989-12-01), Coogan
patent: 4888549 (1989-12-01), Wilson et al.
patent: 4949036 (1990-08-01), Bezinque et al.
patent: 4967155 (1990-10-01), Magnuson et al.
patent: 5239445 (1993-08-01), Parks et al.
patent: 5295247 (1994-03-01), Chang et al.
patent: 5313585 (1994-05-01), Jeffries et al.
patent: 5313626 (1994-05-01), Jones et al.
patent: 5361346 (1994-11-01), Panesar et al.
patent: 5404454 (1995-04-01), Parks
patent: 5530960 (1996-06-01), Parks et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for addressing and testing more than two AT does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for addressing and testing more than two AT, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for addressing and testing more than two AT will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-604966

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.