Image analysis – Pattern recognition
Patent
1993-06-24
1995-08-15
Razavi, Michael T.
Image analysis
Pattern recognition
382190, G06K 962, G06K 946
Patent
active
054427169
ABSTRACT:
An adaptive learning type general purpose image measurement and recognition method includes the steps of extracting a large number of basic initial features having values which are invariant to parallel displacement of an object to be caught in an image frame and which have additivity with respect to the image frame, and performing statistical feature extraction having a learning function on the basis of a multivariate analysis method applied to the extracted initial features to thereby adaptively enable use for various types of measurement. Further, An adaptive learning type general purpose image measurement and recognition apparatus includes a pick-up device for picking up objects of measurement in two dimensions, an image cutting-out device for partially cutting out video signals of the picked-up images, a correlating device for computing Nth order autocorrelation of the cut-out data, a memory device for storing coefficients of the autocorrelation, and an arithmetic controlling device respetive devices and for carrying out multivariate analysis based on the computed values to thereby adaptively enable use for various types of measurement.
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Kurita Takio
Kuwashima Shigesumi
Otsu Nobuyuki
Agency of Industrial Science and Technology
Fox David
Kabushiki Kaisha Ouyo Keisoku Kenkyusho
Razavi Michael T.
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