Data processing: measuring – calibrating – or testing – Calibration or correction system – Length – distance – or thickness
Reexamination Certificate
2007-06-20
2009-11-10
Tsai, Carol S (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Length, distance, or thickness
C702S105000, C701S050000, C219S121670, C219S121690, C219S121720, C219S121750, C219S121830, C219S121820, C219S121730, C356S141100, C356S139010, C356S139030, C356S139100
Reexamination Certificate
active
07617061
ABSTRACT:
Disclosed is a method and apparatus for processing signals in a satellite/laser positioning system capable of generating location coordinates from received satellite signals and a received laser signal. A height coordinate bias value is maintained by a filter processor during periods when the laser signal is available. The height coordinate bias value represents an estimated difference between a satellite signal derived height coordinate and a laser signal derived height coordinate. During periods when the laser signal is available, the laser signal derived height coordinate is output. During periods when the laser signal is not available, a corrected height coordinate value is generated by applying the height coordinate bias value to the satellite signal derived height coordinate.
REFERENCES:
patent: 6189626 (2001-02-01), Hanseder
patent: 6268824 (2001-07-01), Zhodzishky et al.
patent: 6450267 (2002-09-01), Ohtomo et al.
patent: 7310138 (2007-12-01), Nichols et al.
patent: 2001/0023766 (2001-09-01), Ohtomo et al.
patent: 2005/0274879 (2005-12-01), Osaragi et al.
patent: 2006/0012777 (2006-01-01), Talbot et al.
patent: 2006/0279727 (2006-12-01), Nichols et al.
patent: 2007/0058161 (2007-03-01), Nichols et al.
patent: 2008/0208417 (2008-08-01), Buehlmann et al.
Topcon Positioning Systems, Inc.
Tsai Carol S
Weinick Jeffrey M.
Wolff & Samson PC
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