Method and apparatus for accurate on-die temperature...

Details Method and apparatus for accurate on-die temperature... Method and apparatus for accurate on-die temperature...

2006-12-12

2006-12-12

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

C702S132000

Reexamination Certificate

active

07149645

ABSTRACT:
A device and method for continually monitoring multiple thermal sensors located at hotspots across a processor. The sensors are connected to a sensor cycling and selection block located at a periphery of the die. The output from the sensor selection block is converted into a digital temperature code. Based on the digital temperature code, thermal events trigger various thermal controls. The thermal event triggers may be software-programmable, providing flexible temperature management.

REFERENCES:
patent: 6980918 (2005-12-01), Gunther et al.

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