Method and apparatus for a wobble fixture probe for probing...

Details Method and apparatus for a wobble fixture probe for probing... Method and apparatus for a wobble fixture probe for probing...

2007-01-09

2007-01-09

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020

Reexamination Certificate

active

10978100

ABSTRACT:
A method and apparatus for a wiping fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit board during in-circuit testing.

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patent: 6570399 (2003-05-01), Yeghiayan et al.
patent: 6696850 (2004-02-01), Sanders

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