Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-04-26
2011-04-26
Khuu, Cindy Hien-Dieu (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07933726
ABSTRACT:
A system, method, and apparatus for obtaining a record of logic level transitions within a signal, and for accurately determining a voltage-time pair exhibited by the signal. To achieve these ends, a front-end device may be mated to a real-time sampling system, such as an oscilloscope. The front-end device effectively permits the oscilloscope to observe signals exhibiting greater data rates than otherwise possible without the front-end device.
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patent: 6753677 (2004-06-01), Weller et al.
patent: 2001/0001850 (2001-05-01), Miller
patent: 2005/0099235 (2005-05-01), Sakamoto et al.
patent: 2005/0189950 (2005-09-01), Lu
Fraasch Steven
Hamre John D.
Li Peng
Gigamax Technologies, Inc.
Khuu Cindy Hien-Dieu
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