Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate
2009-01-29
2011-11-15
Donovan, Lincoln (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
With specific source of supply or bias voltage
C327S538000, C323S315000, C323S316000
Reexamination Certificate
active
08058924
ABSTRACT:
A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.
REFERENCES:
patent: 5172073 (1992-12-01), Fujii
patent: 5519309 (1996-05-01), Smith
patent: 5621357 (1997-04-01), Botti et al.
patent: 5990711 (1999-11-01), Sekimoto
patent: 6504397 (2003-01-01), Hart et al.
patent: 6630863 (2003-10-01), Tsuchiya
patent: 7071739 (2006-07-01), Duzevik et al.
patent: 7098904 (2006-08-01), Kato
patent: 7330056 (2008-02-01), Lu
patent: 7635990 (2009-12-01), Ren et al.
patent: 2002/0109525 (2002-08-01), Shin
patent: 2005/0007150 (2005-01-01), Omote
patent: 2005/0248391 (2005-11-01), Itoh
patent: 2006/0232326 (2006-10-01), Seitz et al.
patent: 2007/0279105 (2007-12-01), Sunairi
patent: 2008/0001592 (2008-01-01), Conte et al.
patent: 2008/0018318 (2008-01-01), Hsu
patent: 2008/0180130 (2008-07-01), Hayami et al.
patent: 2008/0204120 (2008-08-01), Park
patent: 2009/0051416 (2009-02-01), Ibuka
patent: 2009/0091357 (2009-04-01), Muniyappa et al.
patent: 2009/0195302 (2009-08-01), Lin et al.
U.S. Appl. No. 12/175,925, filed Jul. 18, 2008, Ren et al.
U.S. Appl. No. 12/362,412, filed Jan. 29, 2009, Ren et al.
U.S. Appl. No. 12/362,417, filed Jan. 29, 2009, Ren et al.
Rau Prasad
Ren Guo Jun
Tan Jian
Zhang Qi
Cole Brandon
Donovan Lincoln
King John J.
Wallace Michael T.
Xilinx , Inc.
LandOfFree
Method and apparatus for a process, voltage, and temperature... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for a process, voltage, and temperature..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for a process, voltage, and temperature... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4287585