Optics: measuring and testing – Refraction testing
Reexamination Certificate
2006-03-21
2006-03-21
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Refraction testing
C356S133000, C356S134000, C356S136000, C250S339120, C250S269100
Reexamination Certificate
active
07016026
ABSTRACT:
The invention relates to refractometry and attenuated reflectance spectrometry in a wellbore environment. Specifically, it pertains to a robust apparatus and method for measuring refractive index of fluids along a continuum (rather than in steps), and for measuring attenuated reflectance spectra, and for interpreting the measurements made with this apparatus to determine a variety of formation fluid parameters. The present invention provides a method and apparatus to distinguish between gas and liquid based on the much lower index of refraction of gas. It can also be used to monitor fluid sample clean up over time. The refractive index of a wellbore fluid is determined from the fraction, R, of light reflected off the interface between a transparent window that has a known refractive index and this fluid. Preferably, the refractive index is measured at some wavelength of light for which the fluid is not highly attenuating but is optimally attenuating. The adjacent transmission spectrometer can be used to correct the refractive index measurement for attenuation at those wavelengths, which it monitors. Also, this reflection-based refractometer design can be used as an attenuated reflectance spectrometer at highly attenuating wavelengths.
REFERENCES:
patent: 2807976 (1957-10-01), Vossberg
patent: 2885923 (1959-05-01), Simmons
patent: 3770352 (1973-11-01), White
patent: 3869208 (1975-03-01), Lorenz
patent: 4276475 (1981-06-01), Nelson
patent: 4427293 (1984-01-01), Harmer
patent: 4440022 (1984-04-01), Masom
patent: 4540285 (1985-09-01), Amer
patent: 4569590 (1986-02-01), Karny et al.
patent: 4609821 (1986-09-01), Summers
patent: 4699516 (1987-10-01), Bartz et al.
patent: 4704029 (1987-11-01), Van Heuvelen
patent: 4711126 (1987-12-01), Houpt et al.
patent: 4745293 (1988-05-01), Christensen
patent: 4803470 (1989-02-01), Fineman
patent: 4834533 (1989-05-01), Horike et al.
patent: 4844608 (1989-07-01), Smith
patent: 4997278 (1991-03-01), Finlan et al.
patent: 5028139 (1991-07-01), Kramer et al.
patent: 5055699 (1991-10-01), Konig et al.
patent: 5083018 (1992-01-01), Rhyne
patent: 5166747 (1992-11-01), Schroeder et al.
patent: 5167149 (1992-12-01), Mullins et al.
patent: 5201220 (1993-04-01), Mullins et al.
patent: 5241859 (1993-09-01), Smith
patent: 5250186 (1993-10-01), Dollinger et al.
patent: 5304795 (1994-04-01), Fujihira et al.
patent: 5305071 (1994-04-01), Wyatt
patent: 5325170 (1994-06-01), Bornhop
patent: 5396325 (1995-03-01), Carome et al.
patent: 5436454 (1995-07-01), Bornstein et al.
patent: H1470 (1995-08-01), Ewing et al.
patent: 5442435 (1995-08-01), Cooper et al.
patent: 5680043 (1997-10-01), Hurlimann et al.
patent: 5721430 (1998-02-01), Wong
patent: 5939717 (1999-08-01), Mullins
patent: 5946084 (1999-08-01), Kubulins
patent: 6088656 (2000-07-01), Ramakrishnan et al.
patent: 6130439 (2000-10-01), Le Menn
patent: 6388251 (2002-05-01), Papanyan
patent: 6465775 (2002-10-01), Mullins et al.
patent: 6559639 (2003-05-01), Minh et al.
patent: 2002/0153888 (2002-10-01), Kruspe et al.
patent: 2003/0231017 (2003-12-01), Kiesl et al.
patent: 0116746 (1984-08-01), None
patent: 61011636 (1986-01-01), None
patent: WO 03/016953 (2003-02-01), None
A.R. Smits et al., “In-Situ Optical Fluid Analysis As An Aid To Wireline Formation Sampling”, Society of Petroleum Engineers, SPE Formation Evaluation, Jun. 1, 1995, pp. 91-98.
C.W. Morris et al., “Using Optical Fluid Analysis To Evaluate Downhole Fluid Sample Contamination”, Society of Petroleum Engineers, SPE 50603, Oct. 20-22, 1998, pp. 283-295.
Jean M. Bennett, “Polarization” Handbook of Optics, vol. 1, Fundamentals, Techniques, and Design, Chapter 5, pp. 5.1-5.11.
Bergren Paul
DiFoggio Rocco
Perez Louis
Walkow Arnold
Baker Hughes Incorporated
Madan Mossman & Sriram P.C.
Nguyen Sang H.
Toatley , Jr. Gregory J.
LandOfFree
Method and apparatus for a downhole refractometer and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for a downhole refractometer and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for a downhole refractometer and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3599992