Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-26
2006-12-26
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S073100, C714S724000
Reexamination Certificate
active
07154288
ABSTRACT:
A method and an apparatus for testing transmitter and receiver have been disclosed. One embodiment of the apparatus includes a plurality of multiplexers to select one of a positive and a negative transmitter pins, and a first comparator to compare a voltage of the selected pin with a first reference voltage to determine whether there is leakage at the selected pin. Other embodiments are described and claimed.
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Kakizawa Akira
Swartz Ronald W.
Intel Corporation
Nesheiwat Michael J.
Tang Minh N.
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