Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2002-01-02
2008-09-09
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
C356S614000, C382S148000, C382S149000
Reexamination Certificate
active
07423743
ABSTRACT:
A method and an apparatus for measuring respective positions of a set of N contact elements of an electronic component. A first and a second light path are created by a first and a second light beam which have different viewing angles. Both the first and the second light path can selectively be opened and both end into the image plane of a single camera. The positions being determined by using the first and second image produced by the first and second light beam respectively.
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pate
Everaerts Jurgen
Smets Carl
Van Gils Karel
Zabolitsky John
Arnold Gordon T.
Arnold & Knobloch, L.L.P.
Icos Vision Systems NV
Knobloch Charles S.
Pham Hoa Q
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