Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2007-10-16
2007-10-16
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S641000, C333S109000
Reexamination Certificate
active
11446923
ABSTRACT:
An impedance tuning measurement setup and method for characterizing high frequency devices-under-test whereby one inserts an extremely low loss directive coupling structure between the terminal of the device-under-test and that part of the impedance tuner that generates the variable impedance. One or both coupled arm outputs of the directive coupling structure are connected to the inputs of a broadband RF receiver. By using the extremely low loss directive coupling structure one avoids the loss of energy caused by the distributed directional couplers or the resistive bridges used in prior art. The low loss directive coupling structure is formed by a small piece of conductive wire, which is inserted into the electro-magnetic waveguiding structure that guides the RF signals towards and from the DUT terminals. The ends of the small piece of conductive wire are connected to the center conductors of two electromagnetic waveguiding structures, which act as the coupling arms.
REFERENCES:
patent: 2512191 (1950-06-01), Wolf
patent: 3309608 (1967-03-01), Alford
patent: 3409826 (1968-11-01), Goodman
patent: 3522526 (1970-08-01), Sanderson
patent: 3789301 (1974-01-01), Malaviya
patent: 4072897 (1978-02-01), Takayama
patent: 4720677 (1988-01-01), Donecker
patent: 4803419 (1989-02-01), Roos
patent: 5034708 (1991-07-01), Adamian
patent: 5121067 (1992-06-01), Marsland
patent: 5325019 (1994-06-01), Miller
patent: 5557245 (1996-09-01), Taketa et al.
patent: 6297649 (2001-10-01), Tsironis
patent: 6509743 (2003-01-01), Ferrero
patent: 6812714 (2004-11-01), Verspecht
patent: 6859029 (2005-02-01), Yamanaka
patent: 6980064 (2005-12-01), Boulerne
patent: 2006/0279275 (2006-12-01), Simpson
patent: 1 316 806 (2003-06-01), None
patent: 1316806 (2003-06-01), None
patent: 338495 (2001-08-01), None
De Groote et al., An improved coupling method for time domain load-pull measurements, ARFTG 65th Conference Digest, Jun. 17, 2005.
Lombardini et al.,Criteria for Design of Loop-Type Directional Couplers for the L Band, IRE Transactions on Microwave Theory and Techniques, Oct. 1956, pp. 234-239.
Microlab/FXR, CE-N and CF-N series Loop Coupler Specifications, Oct. 27, 2005, [available on line] URL: http://www.microlab.fxr.com/pdf/CE-CF-Nseries.pdf.
H.C. Early, A Wide-Band Directional Coupler for Wave Guide, Proceedings of the I.R.E. and Waves and Electrons, Nov. 1946, pp. 883-886, USA.
H.C. Early, A Wide-Band Directional Coupler for Wave Guide, Proceedings of the I.R.E. and Waves and Electrons, Nov. 1946, pp. 883-886, USA.
Teyssier Jean-Pierre
Verspecht Jan
Benson Walter
He Amy
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