Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-21
2006-02-21
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S108000, C702S176000, C700S306000
Reexamination Certificate
active
07003416
ABSTRACT:
A method for monitoring the performance of a test apparatus (1) for testing a batch of integrated circuits. The apparatus1comprises a test site2in which the integrated circuits are sequentially tested, and a microprocessor (4) for carrying out the appropriate tests on the integrated circuits. A first ROM (5) stores a computer programme for controlling the operation of the microprocessor (4) for carrying out the tests, and a first RAM (10) stores a computer programme for controlling the operation of the microprocessor (4) for monitoring the performance of the test apparatus (1). In particular, the computer programme stored in the first RAM (10) operates the microprocessor (4) for computing the test time period for each integrated circuit tested, and also for computing the intervening time periods between each integrated circuit tested. The intervening time periods between the respective test time periods are classified as either first or second category delays or index time periods. An index time is the normal time required between tests. A first category time delay is one which exceeds thirty seconds, while a second category time delay is one which lies between four seconds and thirty seconds. The duration of the first and second category time delays are stored in a second RAM (18), and cross-referenced with the times at which the respective first and second category time delays terminated. This permits analysis of the time delays by category and time of occurrence for facilitating subsequent investigation and corrective action.
REFERENCES:
patent: 6308108 (2001-10-01), Michiwaki et al.
Analog Devices Inc.
Hoff Marc S.
Wolff, Greenfield & Sacks, P.C.
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