Method and a device for measuring dielectric characteristics...

Details Method and a device for measuring dielectric characteristics... Method and a device for measuring dielectric characteristics...

2011-01-11

2011-01-11

Dole, Timothy J (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S637000, C324S638000, C324S702000

Reexamination Certificate

active

07868627

ABSTRACT:
A method and a device for measuring dielectric characteristics by generating a microwave signal, dividing the signal into reference and sounding signals, irradiating a body with the microwave signal, receiving the reflected, reference and total signals and in detecting said signals. The irradiation is carried out by a waveguide wave, the wave number of which in the free space filled with dielectric, is selected within a range from 1.0 to 1.07 the propagation number of the waveguide wave.

REFERENCES:
patent: 5345243 (1994-09-01), Levis
patent: 6100703 (2000-08-01), Davidov et al.
patent: 6798216 (2004-09-01), Jannsen et al.
patent: 2078336 (1997-04-01), None
patent: 2095812 (1997-11-01), None
patent: 2098016 (1997-12-01), None
patent: 1830491 (1993-07-01), None
patent: 1817555 (1995-08-01), None
patent: 62343 (2003-12-01), None
patent: 2006/069721 (2006-07-01), None
International Search Report, mailed Jun. 11, 2008, from International Application No. PCT/RU2008/000046 filed Jan. 25, 2008.
English translation of International Preliminary Report on Patentability, dated Oct. 20, 2009, from International Application No. PCT/RU2008/000046 filed Jan. 25, 2008.
Hayashi, Y. et al., “Free water content and monitoring of healing processes of skin burns studied by microwave dielectric spectroscopy in vivo,” Phys. Med. Biol. 50 (2005) 599-612.

Affiliated with

Also associated with

Rating

Method and a device for measuring dielectric characteristics... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and a device for measuring dielectric characteristics..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and a device for measuring dielectric characteristics... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2643201