Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified load or strain transmission device from specimen...
Reexamination Certificate
2006-08-25
2011-12-20
Wang, Quan-Zhen (Department: 2629)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified load or strain transmission device from specimen...
Reexamination Certificate
active
08079270
ABSTRACT:
A method and apparatus for measuring a force and a position at a linear actuating mechanism (20). In one illustrative embodiment, a change in an electrical characteristic of a first coil system (1, 3a, 6) for measuring a position of the linear actuating mechanism, wherein the change in the electrical characteristic is caused by moving of a first measurement member (6) in the first coil system (1, 3a, 6), and a change in an electrical characteristic of a second coil system (2, 3b, 5) for measuring a force acting at the linear actuating mechanism (20), wherein the change in the electrical characteristic is caused by moving of a second measurement member (5) in the second coil system (2, 3b, 5), are detected. The movement of the first measurement member (6) is generated by a positional change of a linear shaft member of the linear actuating mechanism (20), and the movement of the second measurement member (5) is generated by a force-displacement conversion via a deformation member.
REFERENCES:
patent: 3731184 (1973-05-01), Goldberg et al.
patent: 4121049 (1978-10-01), Roeber
patent: 4578604 (1986-03-01), Eilertsen
patent: 5046702 (1991-09-01), Miyazawa et al.
patent: 5161083 (1992-11-01), Mohler et al.
patent: 5301895 (1994-04-01), Sheehan et al.
patent: 5467244 (1995-11-01), Jayawant et al.
patent: 6565064 (2003-05-01), Smith et al.
patent: 2001/0043450 (2001-11-01), Seale et al.
patent: 2003/0059219 (2003-03-01), Takahashi et al.
patent: 2003/0114748 (2003-06-01), Su et al.
patent: 2003/0121261 (2003-07-01), Geiger
patent: 2004/0055318 (2004-03-01), Hirota
patent: 2004/0083993 (2004-05-01), Seale et al.
patent: 2004/0122536 (2004-06-01), Saitou
patent: 2004/0177612 (2004-09-01), Geiger
patent: 2004/0244209 (2004-12-01), Uehira et al.
patent: 2005/0001556 (2005-01-01), Hoffman et al.
patent: 2005/0077855 (2005-04-01), Hochhalter et al.
patent: 2005/0242815 (2005-11-01), Morris et al.
patent: 2006/0059989 (2006-03-01), Wang et al.
patent: 2006/0066269 (2006-03-01), Lumley et al.
patent: 2006/0171091 (2006-08-01), Seale et al.
patent: 2006/0175190 (2006-08-01), Schuetze et al.
patent: 2006/0202682 (2006-09-01), Mednikov et al.
patent: 2006/0254651 (2006-11-01), Hodge et al.
patent: 2007/0145316 (2007-06-01), Morikawa
patent: 2007/0241298 (2007-10-01), Herbert et al.
patent: 2008/0017255 (2008-01-01), Petersen
patent: 2011/0061559 (2011-03-01), Lund
patent: 2289947 (1995-12-01), None
Bayer Dieter
Ebert Volker
Gratz Petr
Hanus Milos
Pangrac Pavel
Davis Tony
Honeywell Technologies SARL
Seager Tufte & Wickhem LLC
Wang Quan-Zhen
LandOfFree
Method and a device for measuring a force and a position does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and a device for measuring a force and a position, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and a device for measuring a force and a position will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4268676