Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2005-06-17
2009-08-04
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
C356S634000, C356S237200, C250S559360
Reexamination Certificate
active
07570369
ABSTRACT:
In a method for measuring the size or shape of an edge of a machined work piece or of a cutting edge of a tool, the surface of the edge is illuminated by diffused radiation from several positions in the vicinity to the edge by an illumination arrangement, and a picture of the edge is reproduced by recording reflected radiation from the illuminated edge by means of a picture reproduction unit.
REFERENCES:
patent: 5679161 (1997-10-01), Wysokowski et al.
patent: 6580813 (2003-06-01), Hermans et al.
patent: 7161667 (2007-01-01), Meeks et al.
patent: 7266420 (2007-09-01), Budd
patent: 2002/0154298 (2002-10-01), Hagen et al.
patent: 2002/0163573 (2002-11-01), Bieman et al.
patent: 2005/0023491 (2005-02-01), Young et al.
patent: 2008/0030731 (2008-02-01), Jin et al.
patent: 2009/0086196 (2009-04-01), Sakaguchi
patent: 2009/0091748 (2009-04-01), Nohara et al.
patent: 2009/0097018 (2009-04-01), Watanabe
patent: 2009/0116727 (2009-05-01), Jin et al.
patent: 4297810 (1992-10-01), None
patent: 2001264032 (2001-09-01), None
International Search Report for corresponding International Application PCT/SE2005/000970.
International Preliminary Report on Patentability for corresponding International Application PCT/SE2005/000970.
Pham Hoa Q
Volvo Aero Corporation
WRB-IP LLP
LandOfFree
Method and a device for measurement of edges does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and a device for measurement of edges, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and a device for measurement of edges will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4097939